FE Electrical and Computer Practice Problems

The "FE Electrical and Computer Practice Problems" book authored by Michael Lindeburg is designed to help students preparing for the Fundamentals of Engineering (FE) exam. This book contains a collection of 450 multiple-choice practice problems that are similar to those found in the actual FE exam.

The book covers a wide range of topics such as circuit analysis, electronics, digital systems, power systems, electromagnetics, control systems, communication systems, computer systems, and many more. Each chapter begins with a brief overview of the topic, followed by solved example problems and practice problems. The solutions to the practice problems are provided at the end of the book, along with a complete index of the topics covered.

The book is organized into two main sections: the first section covers topics that are common to both the electrical and computer engineering exams, while the second section covers topics that are specific to the computer engineering exam. This division helps students focus on the areas that are relevant to their specific exam.

One of the key features of the book is the detailed step-by-step solutions provided for each problem. These solutions are designed to help students understand the underlying concepts and principles that are necessary for solving similar problems on the actual exam. In addition, the book includes several tips and strategies for solving problems quickly and efficiently.

The book also includes several useful appendices, including a list of key equations, a glossary of electrical and computer engineering terms, and a list of recommended references for further study.

Overall, "FE Electrical and Computer Practice Problems" is a valuable resource for students preparing for the FE exam in electrical or computer engineering. Its comprehensive coverage of topics, detailed solutions, and helpful tips make it an excellent tool for students looking to improve their problem-solving skills and increase their chances of passing the exam.